ITEM# C12007

300mm P/B <1-0-0> 1-100 ohm-cm, 775±25µm TEST SILICON WAFER
DOUBLE SIDE POLISHED, ONE SEMI NOTCH, T7+M12 LASER SCRIBE ON BACKSIDE OR NO LASER MARK
BOW <75µm, WARP <75µm, TTV <25µm
PARTICLE <100@>0.2µm, OTHER PARAMETERS PER SEMI STANDARD
IN FACTORY SEALED CASSETTE, 25 WAFERS PER CASSETTE